Key responsibilities include:
- EM modelling, design and characterization of RF SOI calibration and de-embedding structures, including on-wafer electromagnetic environment (substrate, neighbouring structures, measurement probes, …) at mmWave frequencies;
- mmWave on-wafer characterization and modelling of SOI substrates, MOSFET devices and circuits;
- Collaboration with device and reliability engineers and researchers working at Incize, SOITEC, CEA-Leti, ST-Microelectronics, and GlobalFoundries.
Université catholique de Louvain (UCLouvain)